Systematic electron diffraction by H.C.P. metals. II. The critical voltage effect-Reference-Cited by-同舟云学术

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Systematic electron diffraction by H.C.P. metals. II. The critical voltage effect

Published:1978-06-16 Issue:2 Volume:47 Page:385-395
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Jones I. P.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. The critical voltage effect in high voltage electron microscopy

2. Application of the critical voltage effect to the study of ordering in alloys

3. M.Sc. Thesis, Univ. Birmingham, 1977.

4. and , in: High Voltage Electron Microscopy, Ed. , and , Academic Press, London 1974 (p. 52).

5. , , and , High Voltage Electron Microscopy, (p. 38).

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the accurate measurement of structure-factor amplitudes and phases by electron diffraction;Acta Crystallographica Section A Foundations of Crystallography;1993-03-01

2. The low-angle atomic scattering factors and charge density of zinc;Philosophical Magazine Letters;1990-10

3. Low-angle atomic scattering factors and the charge density of beryllium;Philosophical Magazine B;1988-02

4. A Summary of Low-angle X-ray Atomic Scattering Factors Measured by the Critical Voltage Effect in High Energy Electron Diffraction;Australian Journal of Physics;1988

5. The measurement of low-angle structure factors of Cu3Au by high energy electron diffraction;Philosophical Magazine B;1984-10

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