Grain boundary analysis in TEM. V. A. Criterion for the identification of a CSL and a characterization of an approximate CSL-Reference-Cited by-同舟云学术

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Grain boundary analysis in TEM. V. A. Criterion for the identification of a CSL and a characterization of an approximate CSL

Published:1981-09-16 Issue:1 Volume:67 Page:249-257
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Bleris G. L.,Antonopoulos J. G.,Karakostas Th.,Delavignette P.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Grain boundary analysis in TEM. I. Practical determination of bicrystal orientations

2. Grain boundary analysis in TEM III. Determination of conditions for csl and application in copper

3. Pseudo-subgrain-boundaries in stainless steel

4. Disorientations and coincidence rotations for cubic lattices

5. Crystal Defects and Crystalline Interfaces, Springer-Verlag, Berlin 1970.

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