The dependence of scanning electron acoustic microscopy (SEAM) imaging on chopping and detection frequency for metal samples-Reference-Cited by-同舟云学术

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The dependence of scanning electron acoustic microscopy (SEAM) imaging on chopping and detection frequency for metal samples

Published:1984-03-16 Issue:1 Volume:82 Page:23-33
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Balk L. J.,Davies D. G.,Kultscher N.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference14 articles.

1. in: Scanned Image Microscopy, Academic Press, 1980 (p. 319).

2. Thermal‐wave microscopy with electron beams

3. see [1] (p. 23).

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