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An analysis of the symmetries in electron microscope images of a sloping dislocation and its application as a method for dislocation characterization

  • Published:1974-04-16 Issue:2 Volume:22 Page:599-608
  • ISSN:0031-8965
  • Container-title:Physica Status Solidi (a)
  • language:en
  • Short-container-title:Phys. Stat. Sol. (a)

Author:

Ingram J. C.,Strutt P. R.,Tzeng Wen-Shian

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. and , Proc. 30th Annual Meeting Electron Microscope Soc. Amer. 1973, (p. 660).

2. The Computer Generation of Electron Microscope Pictures of Dislocations

3. Diffraction contrast of electron microscope images of crystal lattice defects - II. The development of a dynamical theory

4. and , Theory of Dislocations, McGraw-Hill Publ. Co., New York 1968.

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1. Symmetries in transmission electron microscopy imaging of crystals with strain;Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences;2022-11

2. Contrast symmetry and defect identification;Proceedings, annual meeting, Electron Microscopy Society of America;1990-08

3. Deformation structure in a Ti-24Al-11Nb alloy;Metallurgical Transactions A;1990-02

4. Plasticity in β phase Cu-Zn-Al alloys;Philosophical Magazine A;1988-12

5. Burgers vector determination of V-shaped dislocations in InGaAs layers grown on (001) InP substrates;Philosophical Magazine A;1986-03
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