Author:
Bär H.-P.,Krause H.,Schulze H.
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. The Dependence of the SiO2 Defect Density on Both the Applied Electric Field and the Oxide Thickness
2. Time Dependent MOS Gate Oxide Defects Using Liquid Crystals
3. , and , Flüssigkristalle in der Optoelektronik, Probleme der Festkörperphysik, Vol. 4, VEB Verlag Technik, Berlin 1972.
4. , and , 32. Internat. Coll. Ilmenau, Vol. 4, Ilmenau 1987 (p. 151).
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