Preparation of cells cultured on silicon wafers for mass spectrometry analysis-Reference-Cited by-同舟云学术

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Preparation of cells cultured on silicon wafers for mass spectrometry analysis

Published:2005 Issue:5 Volume:66 Page:248-258
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc. Res. Tech.

Author:

Wittig Andrea,Wiemann Martin,Fartmann Michael,Kriegeskotte Christian,Arlinghaus Heinrich F.,Zierold Karl,Sauerwein Wolfgang

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Reference42 articles.

1. 2002a. Laser-SNMS. In: editor. Surface and thin film analysis. Principles, instrumentation, applications. Hoboken: Wiley-VCH. p 132-141.

2. 2002b. Static secondary ion mass spectrometry (SSIMS). In: editor. Surface and thin film analysis. Principles, instrumentation, applications. Hoboken: Wiley-VCH. p 86-106.

3. Imaging of Boron in Tissue at the Cellular Level for Boron Neutron Capture Therapy

4. Subcellular imaging of cell cultures and tissue for boron localization with laser-SNMS

5. The culture of neurons on silicon

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3. Secondary Ion Mass Spectrometry Imaging of Biological Cells and Tissues;Methods in Molecular Biology;2013-12-02

4. Characterization of sample preparation methods of NIH/3T3 fibroblasts for ToF-SIMS analysis;Biointerphases;2013-12

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