Investigation of vacuum measurement by nano‐gap device

Author:

Komiya Kazuki12,Nagata Koki1,Yamaoka Hidehiko1,Date Shuichi1,Miyashita Yuito1,Yan Min2

Affiliation:

1. Tokyo Metropolitan Industrial Technology Research Institute Tokyo Japan

2. Tokyo Metropolitan University Tokyo Japan

Abstract

AbstractAdvances in microfabrication technology have enabled electron beam lithography (EB lithography) systems to produce microfabrication on the order of 10 of nanometers. Using this technology, we have fabricated nanogap electrodes that can generate large electric fields at low voltages. The gap between the tips of the fabricated electrodes is 100 nm, and the curvature of each tip is 50 nm. The device was confirmed to work as an electronic vacuum gauge, the device successfully measured vacuum from 10−3 to 1 Pa at the electrode voltage of 3 V.

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Networks and Communications,General Physics and Astronomy,Signal Processing

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