Spatially Resolved Identification of Shunt Defects in Thin Film Solar Cells via Current Transport Efficiency Imaging Combined with 3D Finite Element Modeling-Reference-Cited by-同舟云学术

Spatially Resolved Identification of Shunt Defects in Thin Film Solar Cells via Current Transport Efficiency Imaging Combined with 3D Finite Element Modeling

Published:2019-02-28 Issue:5 Volume:3 Page:1800342
ISSN:2367-198X
Container-title:Solar RRL
language:en
Short-container-title:Sol. RRL

Author:

Ren Aobo¹²^ORCID,Xu Hao²,Zhang Jiaqi²^ORCID,Hung Hsianghung²,Delamarre Amaury²,Watanabe Kentaroh²,Zhang Jingquan¹^ORCID,Wu Lili¹^ORCID,Liu Cai³,Sugiyama Masakazu²

Affiliation:

1. College of Materials Science and Engineering, Sichuan UniversityChengdu 610064China

2. Research Center for Advanced Science and Technology, The University of TokyoTokyo 153‐8904Japan

3. Shenzhen Institute for Quantum Science and Engineering, and Department of Physics, Southern University of Science and TechnologyShenzhen 518055China

Funder

China Scholarship Council

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/solr.201800342

Reference49 articles.

1. High-efficiency polycrystalline CdTe thin-film solar cells

2. A review of thin film solar cell technologies and challenges

3. Solar cell efficiency tables (version 52)

4. Thin-film solar cells: an overview

5. Thin-film solar cells: review of materials, technologies and commercial status

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