Variability analysis of resistive ternary content addressable memories-Reference-Cited by-同舟云学术

Variability analysis of resistive ternary content addressable memories

Published:2020-12-22 Issue:2 Volume:49 Page:453-475
ISSN:0098-9886
Container-title:International Journal of Circuit Theory and Applications
language:en
Short-container-title:Int J Circ Theor Appl

Author:

Bahloul Mohamed A.¹²^ORCID,Fouda Mohammed E.³⁴^ORCID,Barraj Imen¹,Masmoudi Mohamed¹

Affiliation:

1. Department of Electrical Engineering, Laboratory of Micro‐Electro Thermal Systems (METS), National Engineering School of Sfax University of Sfax Sfax Tunisia

2. Computer, Electrical and Mathematical Sciences and Engineering Division King Abdullah University of Science and Technology Thuwal Saudi Arabia

3. Engineering Math. and Physics Department Cairo University Giza Egypt

4. Electrical Engineering and Computer Science Department University of California‐Irvine Irvine California USA

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/cta.2919

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