Simulation modelling of III‐Nitride / β ‐Ga 2 O 3 Nano‐HEMT for microwave and millimetre wave applications

Author:

Rao G. Purnachandra1ORCID,Singh Rajan2ORCID,Lenka Trupti Ranjan1ORCID,Boukortt Nour El. I.3ORCID,Nguyen Hieu Pham Trung4ORCID

Affiliation:

1. Department of Electronics and Communication Engineering National Institute of Technology Silchar Silchar India

2. Department of Electronics and Communication Engineering MLR Institute of Technology Hyderabad India

3. Electronics and Communication Engineering Department Kuwait College of Science and Technology Doha Qatar

4. Department of Electrical and Computer Engineering New Jersey Institute of Technology Newark New Jersey USA

Funder

Science and Engineering Research Board

Publisher

Hindawi Limited

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Linearity analysis of III-Nitride/β-Ga2O3 Nano-HEMT for emerging RF/Microwave applications;Microsystem Technologies;2024-08-28

2. Effect of temperature dependence of 2DEG on device characteristics of field‐plated recessed‐gate III‐nitride/βGa2O3 nano‐HEMT;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2024-07

3. Recent Trends in FET and HEMT-Based Biosensors for Medical Diagnosis;Nanoelectronic Devices and Applications;2024-06-26

4. An Overview of Reliability Issues and Challenges Associated with AlGaN/GaN HEMT;Nanoelectronic Devices and Applications;2024-06-26

5. Study of DC Characteristics of AlGaN/GaN HEMT and its Compact Models;Nanoelectronic Devices and Applications;2024-06-26

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