Comparison of free‐space VNA and TDS measurements using transmission‐type frequency selective surfaces

Author:

Kato Yuto1ORCID,Kato Eiji2ORCID

Affiliation:

1. Research Institute for Physical Measurement National Institute of Advanced Industrial Science and Technology Ibaraki Japan

2. New Area Business Development Initiative Advantest Corporation Saitama Japan

Abstract

AbstractA method for directly comparing vector network analyzer (VNA) and time‐domain spectrometer (TDS) measurements in free space using transmission‐type frequency selective surfaces (FSSs) is proposed. The transmission characteristics of FSSs with artificially controlled frequency dispersions facilitate flexible and detailed comparisons of VNA and TDS measurements. Four FSSs were designed as verification devices of free space measurements. The proposed approach was demonstrated in the D and J bands by comparing the measurement results of the transmission amplitude and phase characteristics of the FSSs obtained using VNA and TDS systems. The amplitude and phase results obtained using both systems were in good agreement, confirming the consistency and validity of the VNA and TDS measurements.

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Double-Notch Frequency-Coded Corner Reflectors for Sub-THz Chipless RFID Tags;IEEE Antennas and Wireless Propagation Letters;2024-09

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