Interface engineering and characterization at the atomic-scale of pure and mixed ion layer gas reaction buffer layers in chalcopyrite thin-film solar cells-Reference-Cited by-同舟云学术

Interface engineering and characterization at the atomic-scale of pure and mixed ion layer gas reaction buffer layers in chalcopyrite thin-film solar cells

Published:2014-03-11 Issue:6 Volume:23 Page:705-716
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog. Photovolt: Res. Appl.

Author:

Cojocaru-Mirédin Oana¹,Fu Yanpeng²,Kostka Aleksander¹,Sáez-Araoz Rodrigo²,Beyer Andreas³,Knaub Nikolai³,Volz Kerstin³,Fischer Christian-Herbert²,Raabe Dierk¹

Affiliation:

1. Max-Planck-Institut für Eisenforschung; Max-Planck-Str. 1 40237 Düsseldorf Germany

2. Helmholtz-Zentrum Berlin für Materialien und Energie; Institute of Heterogeneous Materials Systems; Hahn-Meitner-Platz 1 D-14109 Berlin Germany

3. Philipps-Universität Marburg; Hans-Meerwein-Straße D-35032 Marburg Germany

Funder

Federal Ministry for Education and Research (Germany)

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pip.2484/fullpdf

Reference46 articles.

1. Empa Empa.ch: A new world record for solar cell efficiency 2013 http://www.empa.ch/plugin/template/empa/3/131438/---/l=2

2. Chemical Solution Deposition of Inorganic Films

3. Mechanism of chemical bath deposition of cadmium-sulfide thin-films in the ammonia-thiourea system - in-situ kinetic-study and modelization;Ortega-Borges;Journal of the Electrochemical Society,1993

4. Buffer layers and transparent conducting oxides for chalcopyrite Cu(In,Ga)(S,Se)2 based thin film photovoltaics: present status and current developments;Naghavi;Progress in Photovoltaics,2010

5. Indium sulfide thin films deposited by the spray ion layer gas reaction technique;Allsop;Thin Solid Films,2006

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Quantitative Investigation of Functionalized Glazing Stacks by Atom Probe Tomography;Advanced Materials Technologies;2022-11-07

2. Correlative microscopy and techniques with atom probe tomography: Opportunities in materials science;MRS Bulletin;2022-07

3. Impact of RbF post deposition treatment on CdS/CIGSe and Zn(O,S)/CIGSe interfaces – A comparative HAXPES study;Renewable Energy;2021-12

4. Intense sulphurization process can lead to superior heterojunction properties in Cu(In,Ga)(S,Se)2 thin-film solar cells;Nano Energy;2021-11

5. Atom probe tomography;Nature Reviews Methods Primers;2021-07-22