P-162: Accelerated Lifetime Testing of White OLED Panels for Lighting
Author:
Affiliation:
1. Chemical Materials Evaluation and Research Base (CEREBA), Ibaraki, Japan
2. National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan
3. Japan Advanced Institute of Science and Technology (JAIST), Ishikawa, Japan
Publisher
Wiley
Reference4 articles.
1. Influence of temperature and drive current on degradation mechanisms in organic light-emitting diodes;Ishii;Appl. Phys. Lett.
2. Physical mechanism responsible for the stretched exponential decay behavior of aging organic light-emitting diodes;Fery;Appl. Phys. Lett.,2005
3. An Improved Method for Lifetime Prediction Based on Decoupling of the Joule Self-Heating Effect from Coulombic Degradation in Accelerated Aging Tests of OLEDs;Yoshioka;SID Symposium Digest,2014
4. Comprehensive Analysis of Luminous Decay Curves for Accelerated Lifetime Testing of OLEDs;Yoshioka;SID 2015 Digest,2015
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1. P‐120: Accelerated Lifetime Testing and Degradation Mechanisms of a Blue TADF OLED;SID Symposium Digest of Technical Papers;2023-06
2. Degradation and Reliability of Organic Materials in Organic Light-Emitting Diodes (OLEDs);Reliability of Organic Compounds in Microelectronics and Optoelectronics;2022
3. Hybrid Tandem White OLED with Long Lifetime and 150 Lm W −1 in Luminous Efficacy Based on TADF Blue Emitter Stabilized with Phosphorescent Red Emitter;Advanced Optical Materials;2020-06-29
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