Stable sorghum grain quality QTL were identified using SC35 × RTx430 mapping population-Reference-Cited by-同舟云学术

Stable sorghum grain quality QTL were identified using SC35 × RTx430 mapping population

Published:2022-07-26 Issue:3 Volume:15 Page:
ISSN:1940-3372
Container-title:The Plant Genome
language:en
Short-container-title:The Plant Genome

Author:

Ayalew Habtamu¹^ORCID,Peiris Shantha²,Chiluwal Anuj¹,Kumar Ritesh¹,Tiwari Manish¹^ORCID,Ostmeyer Troy¹^ORCID,Bean Scott²,Jagadish S. V. Krishna¹^ORCID

Affiliation:

1. Dep. of Agronomy Kansas State Univ. Manhattan KS 66506 USA

2. Grain Quality and Structure Research Unit CGAHR, USDA–ARS Manhattan KS 66502 USA

Publisher

Wiley

Subject

Plant Science,Agronomy and Crop Science,Genetics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/tpg2.20227

Reference58 articles.

1. Water‐deficit stress alters intra‐panicle grain number in sorghum

2. Arends D. Prins P. Broman K. W. &Jansen R. C.(2014).Tutorial‐multiple‐QTL mapping (MQM) analysis for R/qtl.

3. Quantitative analysis of gene actions controlling root length under water stress in spring wheat (Triticum aestivum L.) genotypes

4. Starch and Protein Chemistry and Functional Properties

5. Heme-Copper Oxidases and Their Electron Donors in Cyanobacterial Respiratory Electron Transport

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