Comparing lifetime and photoluminescence imaging pattern recognition methodologies for predicting solar cell results based on as-cut wafer properties

Author:

Sinton Ronald A.1,Haunschild Jonas2,Demant Matthias2,Rein Stefan2

Affiliation:

1. Sinton Instruments; Boulder CO USA

2. Fraunhofer Institute for Solar Energy Systems; Freiburg Germany

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Sinton RA Tathgar H Bowden S Cuevas A On the problem of determining the bulk lifetime of unpassivated silicon wafers Proceedings of the 14th NREL Workshop on Crystalline Silicon Solar Cell Materials and Processes 2004 192 195

2. Determination of the bulk lifetime of bare multicrystalline silicon wafers;Bothe;Progress in Photovoltaics: Research and Application,2010

3. Bothe K Krain R Brendel R Falster R Sinton R Determining The bulk lifetime of unpassivated multicrystalline silicon wafers 25th European Photovoltaic Solar Energy Conference and Exhibition /5th World Conference on Photovoltaic Energy Conversion 2010 1828 1833

4. Characterization of multicrystalline silicon wafers by non-invasive measurements;Kunst;Solar Energy Materials and Solar Cells,2001

5. Haunschild J Glatthaar M Kwapil W Rein S Comparing luminescence imaging with illuminated lock-in thermography and carrier density imaging for inline inspection of silicon solar cells Proceedings of the 24th European Photovoltaic Solar Energy Conference 2009 857 862

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