ARDESIA: A fast silicon drift detector X-ray spectrometer for synchrotron applications-Reference-Cited by-同舟云学术

ARDESIA: A fast silicon drift detector X-ray spectrometer for synchrotron applications

Published:2019-02-10 Issue:5 Volume:48 Page:382-386
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrometry

Author:

Hafizh Idham¹²,Bellotti Giovanni¹²,Carminati Marco¹²^ORCID,Utica Gianlorenzo¹²,Gugiatti Matteo¹²,Balerna Antonella³^ORCID,Tullio Vinicio³,Borghi Giacomo⁴⁵,Picciotto Antonio⁴⁵,Ficorella Francesco⁴⁵,Zorzi Nicola⁴⁵^ORCID,Capsoni Andrea²,Coelli Simone²,Bombelli Luca⁶,Fiorini Carlo¹²

Affiliation:

1. Dipartimento di Elettronica, Informazione e Bioingegneria; Politecnico di Milano; Milan Italy

2. INFN, Sezione di Milano; Milan Italy

3. INFN, Laboratori Nazionali di Frascati; Frascati Italy

4. Fondazione Bruno Kessler (FBK); Trento Italy

5. Trento Institute for Fundamental Physics Applications (TIFPA); Trento Italy

6. XGLAB srl; Milan Italy

Funder

Instituto Nazionale di Fisica Nucleare

Publisher

Wiley

Subject

Spectroscopy

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/xrs.3017/fullpdf

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3. M. Newville Consortium for Advanced Radiation Sources, University of Chicago (USA) 2004 http://xafs.org

4. Strategies and limitations for fluorescence detection of XAFS at high flux beamlines

5. http://moxtek.com/xray-product/ap-windows MOXTEK ultra-thin AP-5 Window

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