71‐3: Meeting Optical Testing Challenges of High‐Resolution µLED‐Displays-Reference-Cited by-同舟云学术

71‐3: Meeting Optical Testing Challenges of High‐Resolution µLED‐Displays

Published:2020-08 Issue:1 Volume:51 Page:1063-1066
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest of Technical Papers

Author:

Steinel Tobias¹,Wolf Martin¹

Affiliation:

1. Instrument Systems GmbH Munich Germany

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.14057

Reference6 articles.

1. Spectrometer-Enhanced Imaging Colorimetry;Becker M. E.;SID Symposium Digest of Technical Papers,2017

2. www.instrumentsystems.com/en/products/imaging-colorimeters/lumitop-x150/

3. www.instrumentsystems.com/fileadmin/Downloads/Brochures_Datasheets/LumiTop2700_4000_EN.pdf

4. Wolf “Ultra high resolution light measurement device for subpixel metrology of micro-LEDS and OLEDs” Book of abstracts;Steinel J.;SID conference Eurodisplay,2019

5. https://mojo.vision/press/mojo-vision-unveils-worlds-densest-dynamic-display/

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