EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan-Reference-Cited by-同舟云学术

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EM‐based likelihood inference for one‐shot device test data under log‐normal lifetimes and the optimal design of a CSALT plan

Published:2021-11-09 Issue:2 Volume:38 Page:780-799
ISSN:0748-8017
Container-title:Quality and Reliability Engineering International
language:en
Short-container-title:Quality & Reliability Eng

Author:

Balakrishnan Narayanaswamy¹^ORCID,Castilla Elena²^ORCID

Affiliation:

1. Department of Mathematics and Statistics McMaster University Hamilton Ontario Canada

2. Department of Statistics and O.R. Complutense University of Madrid Madrid Spain

Funder

Natural Sciences and Engineering Research Council of Canada

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/qre.3014

Reference35 articles.

1. Optimum Accelerated Life Tests with a Nonconstant Scale Parameter

2. Accelerated Degradation Tests: Modeling and Analysis

3. Statistical inference on accelerated life testing with dependent competing failure model under progressively type‐II censored data based on copula theory

4. Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution

5. Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A new estimation approach based on phi‐divergence measures for one‐shot device accelerated life testing;Quality and Reliability Engineering International;2024-02-12

2. Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution;Journal of Computational and Applied Mathematics;2024-02

3. Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks;Journal of Computational and Applied Mathematics;2024-02

4. Analysis of one-shot device testing data under logistic-exponential lifetime distribution with an application to SEER gallbladder cancer data;Applied Mathematical Modelling;2024-02

5. An analysis of one-shot devices with multiple components;Developments in Reliability Engineering;2024

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