Advanced Cantilevers for Magnetic Force Microscopy and High Frequency Magnetic Force Microscopy
Author:
Funder
ASPRINT
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.20090/fullpdf
Reference31 articles.
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1. Low temperature scanning force microscopy using piezoresistive cantilevers;Measurement Science and Technology;2015-07-14
2. Characterization of Magnetic Nanoparticles Using Magnetic Force Microscopy;Nanotechnologies for the Life Sciences;2011-01-15
3. Theoretical Description of the High-Frequency Magnetic Force Microscopy Technique;IEEE Transactions on Magnetics;2009-09
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