Nondestructive Method for the Determination of the Electric Polarization Orientation in Thin Films: Illustration on Gallium Ferrite Thin Films-Reference-Cited by-同舟云学术

Nondestructive Method for the Determination of the Electric Polarization Orientation in Thin Films: Illustration on Gallium Ferrite Thin Films

Published:2017-11-13 Issue:12 Volume:1 Page:1700234
ISSN:2366-9608
Container-title:Small Methods
language:en
Short-container-title:Small Methods

Author:

Lefevre Chistophe¹,Demchenko Anna¹,Bouillet Corinne¹,Luysberg Martina²^ORCID,Devaux Xavier³,Roulland François¹,Versini Gilles¹,Barre Sophie¹,Wakabayashi Yusuke⁴,Boudet Nathalie⁵,Leuvrey Cédric¹,Acosta Manuel¹,Meny Christian¹,Martin Elodie¹,Grenier Stéphane⁵,Favre-Nicolin Vincent⁶,Viart Nathalie¹^ORCID

Affiliation:

1. Institut de Physique et Chimie des Matériaux de Strasbourg; CNRS; Université de Strasbourg; UMR 7504 F-67000 Strasbourg France

2. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons; Forschungszentrum Jülich GmbH; Jülich 52425 Germany

3. Institut Jean Lamour; CNRS; Nancy-Université; UMR 7198, CAMPUS ARTEM F-54000 Nancy France

4. Graduate School of Engineering Science; Osaka University; 1-3, Machikaneyama, Toyonaka, Osaka 560-8531 Japan

5. CNRS - Institut Néel; Université Grenoble Alpes; F-38042 Grenoble France

6. ESRF-The European Synchrotron; 71, Avenue des Martyrs F-38000 Grenoble France

Funder

Centre National de la Recherche Scientifique

GALIMEO

Ministère de l'Enseignement Supérieur et de la Recherche

Nanostructures in Interaction with their Environment

Publisher

Wiley

Subject

General Materials Science,General Chemistry

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