High‐Speed Atomic Force Microscopy: Large‐Range HS‐AFM Imaging of DNA Self‐Assembly through In Situ Data‐Driven Control (Small Methods 7/2019)-Reference-Cited by-同舟云学术

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High‐Speed Atomic Force Microscopy: Large‐Range HS‐AFM Imaging of DNA Self‐Assembly through In Situ Data‐Driven Control (Small Methods 7/2019)

Published:2019-07 Issue:7 Volume:3 Page:1970022
ISSN:2366-9608
Container-title:Small Methods
language:en
Short-container-title:Small Methods

Author:

Nievergelt Adrian P.¹,Kammer Christoph²,Brillard Charlène¹,Kurisinkal Eva³,Bastings Maartje M. C.³,Karimi Alireza²,Fantner Georg E.¹

Affiliation:

1. Laboratory for Bio‐ and Nano‐InstrumentationEcole Polytechnique Fédérale de Lausanne (EPFL) 1015 Lausanne Switzerland

2. Automatic Control LaboratoryEcole Polytechnique Fédérale de Lausanne (EPFL) 1015 Lausanne Switzerland

3. Programmable Biomaterials LaboratoryEcole Polytechnique Fédérale de Lausanne (EPFL) 1015 Lausanne Switzerland

Publisher

Wiley

Subject

General Materials Science,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/smtd.201970022

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Integrated optical waveguide atomic force microscopy system with a differential splitter readout;Journal of Nanophotonics;2022-06-21

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