Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
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1. Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment
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3. Influence of primary ion bombardment conditions on the emission of molecular secondary ions
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5. Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
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