1. Kelvin Probe Force Microscopy,;Nonnenmacher;Appl. Phys. Lett.,1991
2. Sample-and-hold Operation in Kelvin Probe Force Microscopy,;Ono;Jpn. J. Appl. Phys.,2005
3. S. Ono T. Takahashi ”Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential,“ to be published in Jpn. J. Appl. Phys .
4. Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe,;Saida;Jpn. J. Appl. Phys.,2003
5. Magnetic Field Detection for Current Evaluation by Magnetic Force Microscopy,;Takahashi;Ultramicroscopy,2004