Broadening of X-ray diffraction lines of crystals containing dislocation distributions-Reference-Cited by-同舟云学术

Broadening of X-ray diffraction lines of crystals containing dislocation distributions

Published:1976 Issue:11 Volume:11 Page:1159-1169
ISSN:0023-4753
Container-title:Kristall und Technik
language:de
Short-container-title:Krist. Techn.

Author:

Wilkens M.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry,Pharmacology (medical),Complementary and alternative medicine,Pharmaceutical Science

Reference27 articles.

1. Ein r�ntgenographisches Verfahren zur Messung der Verteilungskurve der Gitterkonstanten und Netzebenenorientierungen an Einkristallen

2. Elektronenmikroskopische Untersuchung der Versetzungsanordnung verformter Kupfereinkristalle II. Die Versetzungsanordnung im Bereich II

3. Elektronenmikroskopische Untersuchung der Versetzungsanordnung verformter Kupferein kristalle III. Bestimmung der Versetzungsdichte

4. Scattering of X-rays by correlated defect distributions

5. The mechanisms of metal fatigue (I)

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