Microprojection heating caused by the approach of a microparticle
Author:
Affiliation:
1. School of Engineering, The University of Tokyo, 7-3-1, Hongo, Bunkyo-ku; Tokyo 113-8656 Japan
2. Mitsubishi Electric Corp. Advanced Technology R&D Center, 8-1-1, Honmachi, Tsukaguchi; Amagasaki Hyogo 661-8661 Japan
Publisher
Wiley
Subject
Electrical and Electronic Engineering
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/tee.22558/fullpdf
Reference6 articles.
1. Fenski B Fink H Fugel T Gentsch D Rümenapp T 2007
2. Breakdown Characteristics under Metallic Particle Contaminated Conditions in Vacuum Gap
3. Electrical Breakdown Triggered by Micro Particle in Vacuum Gap
4. A method for prediction of gaseous discharge threshold voltage in the presence of a conducting particle
5. The Vacuum Interrupter
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1. Vacuum Breakdown;Theoretical Treatment of Electron Emission and Related Phenomena;2022
2. Late Breakdowns Caused by Microparticles After Vacuum Arc Interruption;IEEE Transactions on Plasma Science;2019-08
3. Motion and Breakdown Related to Microparticles in Vacuum Gap;IEEE Transactions on Plasma Science;2019-08
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