Real-time reliability test for a CPV module based on a power degradation model-Reference-Cited by-同舟云学术

Real-time reliability test for a CPV module based on a power degradation model

Published:2010-12-28 Issue:1 Volume:19 Page:113-122
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog. Photovolt: Res. Appl.

Author:

González J.R.,Vázquez M.,Algora C.,Núñez N.

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference18 articles.

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3. King RR Boca A Hong W Liu X-Q Bhusari D Larrabee D Edmondson KM Law DC Fetzer CM Mesropian S Karam NH Band-gap-engineered architectures for high-efficiency multijunction concentrator solar cells 24th European Phtovoltaic Solar Energy Conference and Exhibition, Hamburg, September 2009

4. Rubio F Banda P Concentrated photovoltaics: the path to high efficiency 2008

5. Wohlgemuth JH Cunningham DW Nguyen AM Miller J Long term reliability of PV module 20th European Photovoltaic Solar Energy Conference, Barcelona, Spain 2005 1942 1946

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