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On the measurement of the complex permittivity of layers embedded in a multilayered dielectric material with the use of a free-space method

  • Published:2002-05-17 Issue:6 Volume:33 Page:422-426
  • ISSN:0895-2477
  • Container-title:Microwave and Optical Technology Letters
  • language:en
  • Short-container-title:Microw. Opt. Technol. Lett.

Author:

Garcia-Ruiz Israel,Aviles-Castro Carlos D.,Jardón-Aguilar Hildeberto,Guerra-Vargas Juan

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies;Ghodgaonkar;. IEEE Trans Instrum Meas,1990

2. A new free-space technique for measuring the complex permittivity and thickness of materials

3. Measuring complex permittivity of materials for frequencies under 18 GHz;Garcia-Ruiz;Appl Microwave Wireless,2001

4. Permittivity measurement of thin liquid layers using open-ended coaxial probes;Folgers;Meas Sci Technol,1996

5. IEEE Press Series on Electromagnetics Waves;Chew,1995

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