Electrical and optical characterisation of TiN porous Si/Si structures-Reference-Cited by-同舟云学术

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Electrical and optical characterisation of TiN porous Si/Si structures

Published:2006 Issue:4 Volume:38 Page:811-814
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Benzekkour N.,Gabouze N.,Sam S.,Saoula N.,Henda K.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference14 articles.

1. Investigation and design of optical properties of porosity superlattices

2. Influence of solution resistivity and post-anodizing treatments of PS films on the electrical and optical properties of metal/PS/Si photodiodes

3. Porous silicon multilayer optical waveguides

4. Enhanced optical properties in porous silicon microcavities

5. Porous Silicon: From Luminescence to LEDs

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study of the deposition of Ti/TiN multilayers by magnetron sputtering;Surface and Interface Analysis;2010-04-13

2. Formation of Rough TiO₂ Thin Films on Glass and Porous Silicon by Sol-Gel Method;Materials Science Forum;2009-01

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