Single‐pass metal artifact reduction using a dual‐layer flat panel detector

Author:

Shi Linxi1,Bennett N. Robert1,Shiroma Amy2,Sun Mingshan2,Zhang Jin2,Colbeth Richard2,Star‐Lack Josh2,Lu Minghui2,Wang Adam S.1

Affiliation:

1. Department of Radiology Stanford University Stanford CA USA

2. Varex Imaging Corporation San Jose CA USA

Funder

National Institutes of Health

Publisher

Wiley

Subject

General Medicine

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