78‐1: Specular Reflection Measurements on Reflective E‐paper Using a Variable Aperture Source-Reference-Cited by-同舟云学术

78‐1: Specular Reflection Measurements on Reflective E‐paper Using a Variable Aperture Source

Published:2019-05-29 Issue:1 Volume:50 Page:1118-1121
ISSN:0097-966X
Container-title:SID Symposium Digest of Technical Papers
language:en
Short-container-title:SID Symposium Digest of Technical Papers

Author:

Hertel Dirk¹,Kelley Edward F.²

Affiliation:

1. E Ink Corporation Billerica MA

2. KELTEK, LLC Longmont CO

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.13125

Reference13 articles.

1. 42-4:Invited Paper: A Full-Color Electrophoretic Display

2. Display reflectance model based on the BRDF

3. 15-1: Application of the Optical Measurement Methodologies of IEC and ISO Standards to Reflective E-Paper Displays

4. International Committee for Display Metrology (ICDM) Information Display Measurements Standard (IDMS) version 1.03 (2012) http://www.icdm‐sid.org/downloads/idms1.html accessed 3‐15‐2019.

5. IEC 62679‐3‐1 Ed1.0Electronic paper displays ‐ Part 3‐1: Optical measuring methods International Electrotechnical Commission (2014).

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1. 18‐1: Combining Annulus and Variable Aperture Source Methods to Separate Specular, Haze and Lambertian Reflection Components of ePaper Displays;SID Symposium Digest of Technical Papers;2023-06

2. 53‐2: Directional variations of specular reflections from displays;SID Symposium Digest of Technical Papers;2021-05

3. 53‐1: Reflection Measurements in ISO TC159 SC4 WG2 and IEC TC110;SID Symposium Digest of Technical Papers;2021-05

4. 64‐1: Separating Specular Reflection from Diffuse Haze for ePaper Using the Extended Variable‐Aperture Source Method;SID Symposium Digest of Technical Papers;2020-08

5. Evaluating Display Reflections in Reflective Displays and Beyond;Information Display;2020-03