Micromachining by Focused Ion Beam (FIB) for Materials Characterization
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,General Materials Science
Reference9 articles.
1. Anwendung der FIB für Materialwissenschaft und Fehleranalyse / Using FIB for Materials Science and Failure Analysis
2. J. Orloff, M. Utlaut, L. Swanson, in High Resolution Focused Ion Beams, Kluwer Academic, New York, 2003.
3. Gallium Artefacts on FIB-milled Silicon Samples
4. Recent developments in micromilling using focused ion beam technology
5. Preparation of soft solder joints
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1. Improvement of the scanning area positioning repeatability using nanomarkers developed with a nanoscratching method;Measurement Science and Technology;2014-03-14
2. Submicron Scale Patterning in Sintered Silica Colloidal Crystal Films Using a Focused Ion Beam;Langmuir;2008-08-20
3. Focused Ion Beam Micro- and Nanoengineering;MRS Bulletin;2007-05
4. Preparative Methods for Nanoanalysis of Materials with Focused Ion Beam Instruments;CHIMIA;2006-11-29
5. Local Fatigue in Lead-Free SnAg3.8Cu0.7 Solder;Advanced Engineering Materials;2006-03
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