XPS study of silicon spheres as a density standard-Reference-Cited by-同舟云学术

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XPS study of silicon spheres as a density standard

Published:2018-12-13 Issue: Volume: Page:
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Zhang Lulu¹^ORCID,Kuramoto Naoki¹^ORCID,Kurokawa Akira¹^ORCID,Fujii Kenichi¹^ORCID

Affiliation:

1. National Metrology Institute of JapanNational Institute of Advanced Industrial Science and Technology Ibaraki Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6594

Reference28 articles.

1. Present state of the solid and liquid density standard;Fujii K;Metrologia,2004

2. Comparative measurement of the density of mercury;Patterson JB;Metrologia,1985

3. Precision density measurement of silicon;Henins I;J Res Natl Bur Stand a,1964

4. A density scale based on solid object;Bowman HA;J Res Natl Bur Stand Sect a,1974

5. A brief history of the unit of mass: continuity of successive definitions of the kilogram;Davis R;Metrologia,2016

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2. In situ template preparation of porous carbon materials that are derived from swine manure and have ordered hierarchical nanopore structures for energy storage;Energy;2022-03

3. Investigating Stability of Si Sphere Surface Layer in Ambient–Vacuum Cyclic Measurements Using Ellipsometry;IEEE Transactions on Instrumentation and Measurement;2021

4. XPS Analysis of a 28Si-Enriched Sphere for Realization of the Kilogram;IEEE Transactions on Instrumentation and Measurement;2021

5. Absolute measurement of the density of silicon spheres to improve the primary density standard of NMIJ;Metrologia;2020-02-25

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