Estimation of the real temperature of samples in IR cell using OH frequency of silica-Reference-Cited by-同舟云学术

Estimation of the real temperature of samples in IR cell using OH frequency of silica

Published:2014-08-07 Issue:1 Volume:47 Page:166-168
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Yamazaki H.¹,Shima H.²,Yoda E.³,Kondo J. N.¹

Affiliation:

1. Chemical Resources Laboratory; Tokyo Institute of Technology; 4259 Nagatsuta-cho, Midori-ku Yokohama 227-8503 Japan

2. Science and Technology Research Center, Inc.; Mitsubishi Chemical Group; 1000 Kamoshida-cho, Aoba-ku Yokohama 227-8502 Japan

3. Department of Chemistry and Material Engineering; Ibaraki National College of Technology; 866 Nakane Hitachinaka City 312-8508 Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference5 articles.

1. Infrared and x-ray photoelectron spectroscopy study of carbon monoxide and carbon dioxide on platinum/ceria

2. Surface binding of an electronic analog to CO: Infrared evidence for CH3NC chemisorption on Rh/Al2O3

3. Combined infrared and programmed desorption study of methanol decomposition on ZnO

4. Infrared Spectroscopic Study of High Temperature Behavior of the Brønsted Acidic Hydroxyl Groups on Zeolites

5. The concentration of SiOH groups under the present pretreatment conditions was estimated as 0.346 mol · g −1 (1.04 sites · nm −2 ) by pyridine adsorption at 25 °C

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