Influence of Hot Carrier Cooling and Band‐Filling Effect on Linewidth of Perovskite Microlasers

Author:

Ma Peipei1,Si Jinhai1ORCID,Yan Lihe1ORCID,Wu Jiayi1,Xu Jin12,Hou Xun1

Affiliation:

1. Key Laboratory for Physical Electronics and Devices of the Ministry of Education & Shaanxi Key Lab of Photonic Technique for Information School of Electronics Science & Engineering Faculty of Electronic and Information Engineering Xi'an Jiaotong University Xi'an 710049 China

2. School of Electronics Engineering and Computer Science Peking University Beijing 100871 China

Abstract

AbstractIn semiconductor‐based microlasers, the generated excited carriers can affect both the optical absorption coefficient and refractive index, influencing the lasing behavior and device performance. In this study, the lasing behavior of individual MAPbBr3 microrods pumped by femtosecond laser pulses is investigated using an ultrafast optical Kerr gating technique. By analyzing the spectral and temporal evolution of the lasing behavior, it is found that the band‐filling (BF) effect can cause a significant change in the refractive index of the material, which results in an unfavorable red‐shift and broadening of the resonant modes, deteriorating the laser linewidth and quality factor. The hot carrier cooling process can provide a buffer for alteration of the energy level occupation state, resulting in a small transient refractive index change and slight red‐shift. These results offer insights into the lasing behavior driven by photogenerated carrier dynamics and provide an optimization strategy for semiconductor‐based microlasers.

Funder

National Natural Science Foundation of China

Publisher

Wiley

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