Characterizing the Thickness Distribution of Donor and Acceptor in Organic Photovoltaics via Quasi‐Monochromatic Light Transmittance

Author:

Chang Jingyu1,Zhang Guoxin1,Zhang Chuwei1,Xu Chenghao1,Xia Huihui12,Deng Weiwei1ORCID,Zhao Xinyan13ORCID

Affiliation:

1. Shenzhen Key Laboratory of Soft Mechanics & Smart Manufacturing Department of Mechanics and Aerospace Engineering Southern University of Science and Technology (SUSTech) Shenzhen 518055 China

2. Shenzhen Jinxin Technology Co., Ltd Shenzhen 518108 China

3. Academy for Advanced Interdisciplinary Studies Southern University of Science and Technology (SUSTech) Shenzhen 518055 China

Abstract

AbstractThe performance of organic solar cells is sensitive to the film thickness and the uniformity of the donor and acceptor distribution in the photoactive layer. Especially, in the quasi‐planar heterojunction fabricated by layer‐by‐layer process, the donor and acceptor materials may be non‐homogeneously distributed across the entire photoactive layer. Visualization of the spatial distributions of donor and acceptor components sheds light on the relationship between nanostructures and device performances. Based on the distinct infrared absorption characteristics of the organic donor and acceptor, a quasi‐monochromatic light transmittance (QMLT) technique is proposed to quantify the donor and/or acceptor thickness in the photoactive layer blend across the entire device area with nanometer precision. The variation in thickness of donor and acceptor can be clearly and separately revealed. Accordingly, the impacts of spin coating techniques (such as dynamic or static dispensing, and on‐center or off‐center spin coating), as well as solvent choices, on film morphology and device performance can be correlated by the noncontact, nondestructive, and convenient QMLT method.

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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