Utilizing Polarization and Multidimensional Spatial Angle‐Resolved Spectroscopy to Reveal the Optical Anisotropy of Few‐Layer Bi2O2Se

Abstract

AbstractThe novel ternary 2D material Bi2O2Se exhibits numerous unique properties in the optical discipline due to its distinctive structure, rendering it of significant research importance and application potential in the domains of new‐generation microelectronics, optoelectronic sensors, and multidimensional optical recognition. However, the optical anisotropy and multidimensional angular resolution of Bi2O2Se have yet to be investigated under the condition of 3D spatial variation of incidence angle. Herein, the spatial optical sensing of the few‐layer Bi2O2Se is investigated under 3D spatially varying incidence conditions using a combination of polarized Raman spectroscopy and multidimensional angle‐resolved spectroscopy. By manipulating the incident angle conditions and adjusting the sample placement angle, a comprehensive optical characterization of materials from diverse spatial orientations is conducted. It is observed that few‐layer Bi2O2Se exhibits a systematically transformed multidimensional spatial photoresponse within visible and near‐infrared wavelengths. This demonstrates the capability of Bi2O2Se as photosensitive semiconductors for 3D stereo optical detection. Furthermore, finite difference time domain simulations reveal that the spatial optical anisotropy of few‐layer Bi2O2Se can be manifested under 3D variable‐angle incidence conditions. The work serves as a crucial guide for the future of Bi2O2Se in anisotropic integrated optics applications, based on polarization‐based chiral recognition.