3D Measurements and Characterizations of Refractive Index Distributions of Volume Holographic Gratings Using Low‐Coherence Holotomography

Author:

Jo Jaepil12ORCID,Baek Dongjae3,Hugonnet Herve12,Kim Kwangjin3,Ji Hyungu4,Lim Yongjun5,Kim Taehong4,Lee Seungwoo3567ORCID,Park YongKeun124ORCID

Affiliation:

1. KAIST Institute for Health Science and Technology KAIST Daejeon 34141 Republic of Korea

2. Department of Physics KAIST Daejeon 34141 Republic of Korea

3. KU‐KIST Graduate School of Converging Science and Technology Korea University Seoul 02841 Republic of Korea

4. Tomocube Inc. Daejeon 34109 Republic of Korea

5. Department of Biomicrosystem Technology Korea University Seoul 02841 Republic of Korea

6. Department of Integrative Energy Engineering and KU Photonics Center Korea University Seoul 02841 Republic of Korea

7. Center for Opto‐Electronic Materials and Devices Post‐Silicon Semiconductor Institute Korea Institute of Science and Technology (KIST) Seoul 02792 Republic of Korea

Abstract

AbstractHolographic Optical Elements (HOEs) employ refractive index (RI) modulation to manipulate light, establishing their widespread application in augmented and virtual reality technologies. Despite significant strides in HOEs' fabrication, a comprehensive 3D examination and measurement of these elements remain largely unexplored. This study targets this void by conducting an in‐depth exploration of the 3D RI distributions of volume holographic gratings (VHGs), a quintessential representative of HOEs. Direct tomographic measurements of the 3D RI distributions within millimeter‐scale VHGs are performed at a spatial resolution of 156 nm × 156 nm × 1.2 µm and an RI precision of 2×10−4. This level of precision facilitates a systematic high‐resolution characterization of VHGs. The findings present a substantial evolution from traditional measurement techniques and promise to considerably advance the evaluation of intricate HOE structures and refine the corresponding fabrication processes.

Funder

National Research Foundation of Korea

Korea Institute of Science and Technology

Publisher

Wiley

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