Affiliation:
1. Key Laboratory of Luminescence and Optical Information Institute of Optoelectronics Technology Beijing Jiaotong University Beijing 100044 China
2. School of Chemical Engineering Sungkyunkwan University 2066 Seobu‐ro, Jangan‐gu Suwon‐si Gyeonggi‐do 16419 Republic of Korea
3. SKKU Advanced Institute of Nano Technology Sungkyunkwan University 2066 Seobu‐ro, Jangan‐gu Suwon‐si Gyeonggi‐do 16419 Republic of Korea
4. SKKU Institute of Energy Science and Technology Sungkyunkwan University 2066 Seobu‐ro, Jangan‐gu Suwon‐si Gyeonggi‐do 16419 Republic of Korea
Abstract
AbstractIn this study, the degradation mechanisms of triplet exciton harvesting organic light‐emitting diodes (OLEDs), namely, phosphorescent OLEDs and thermally activated delayed fluorescence (TADF) OLEDs, are investigated. Two common green emitters, fac‐tris(2‐phenylpyridine) iridium (III) (Ir(ppy)3) and 1,2,3,5‐tetrakis(carbazol‐9‐yl)‐4,6‐dicyanobenzene (4CzIPN), are doped in an exciplex‐forming cohost, and their degradation processes are comprehensively evaluated using various analytical approaches. Triplet–triplet‐annihilation induces the formation of defects, such as charge traps and exciton quenchers, triggering luminance loss during the device aging process of Ir(ppy)3‐based phosphorescent OLEDs. Electron trapping‐induced triplet‐polaron annihilation and narrow emission zone severely impair the device stability of 4CzIPN‐based TADF OLEDs, despite limited material degradation and charge trap formation.
Funder
Ministry of Trade, Industry and Energy
Subject
Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
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