Affiliation:
1. Department of Materials Science and Engineering Pohang University of Science and Technology Pohang 37673 Republic of Korea
Abstract
AbstractRecently cross‐point arrays of synaptic memory devices have been intensively studied to accelerate deep neural network computations. Among various synaptic devices, electrochemical random‐access memory (ECRAM) is emerging as a promising non‐volatile memory candidate owing to its superior synaptic characteristics. However, an optimized update scheme for a three‐terminal ECRAM‐based cross‐point array is yet to be developed. In this study, a metal‐oxide‐based ECRAM (MO‐ECRAM) shows superior synaptic characteristics and the weight update of devices in the MO‐ECRAM cross‐point array is analyzed using the half‐bias (HB) scheme. Additionally, A channel‐high half‐bias (CHB) scheme is proposed to overcome the degraded selectivity of the weight update caused by the three‐terminal configuration of the ECRAM device. In the CHB scheme, the conductance change in the selected device can be increased considerably by applying a calculated additional voltage to the channel. Using the CHB scheme, parallel and selective updates are successfully performed in a 2 × 2 MO‐ECRAM cross‐point array. Finally, an experimental demonstration of the training algorithm shows the impact of selective updates when using the CHB scheme. This new update scheme is expected to improve training accuracy in ECRAM cross‐point array‐based deep learning accelerators.
Funder
Korea Semiconductor Research Consortium
Ministry of Trade, Industry and Energy
Samsung Science and Technology Foundation
IC Design Education Center
National Research Foundation of Korea
Subject
Electronic, Optical and Magnetic Materials
Reference49 articles.
1. Deep learning
2. Brain-inspired computing needs a master plan
3. How to stop data centres from gobbling up the world’s electricity
4. D.Amodei D.Hernandez G.Sastry J.Clark G.Brockman I.Sutskever AI and Compute https://openai.com/research/ai‐and‐compute (accessed: May 2018).
5. C.Li D.Belkin Y.Li P.Yan M.Hu N.Ge H.Jiang E.Montgomery P.Lin Z.Wang J. P.Strachan M.Barnell Q.Wu R. S.Williams J. J.Yang Q.Xia 2018 IEEE Int. Memory Workshop (IMW) IEEE Kyoto Japan2018.
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献