Tunneling‐Effect‐Boosted Interfacial Charge Trapping toward Photo‐Organic Transistor Memory
Author:
Affiliation:
1. Department of Chemical Engineering National Taiwan University of Science and Technology No.43, Sec. 4, Keelung Road, Da'an District Taipei City 10607 Taiwan
Funder
Ministry of Science and Technology, Taiwan
Ministry of Education
Publisher
Wiley
Subject
Electronic, Optical and Magnetic Materials
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/aelm.202101349
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