Numerical determination of coaxial cable parameters in cryogenic environments for high-frequency active device noise modeling

Author:

Cleriti Riccardo1,Colangeli Sergio1,Ciccognani Walter1,Palomba Mirko1,Limiti Ernesto1

Affiliation:

1. Department of Electronic Engineering; University of Rome Tor Vergata; Rome Italy

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modelling and Simulation

Reference24 articles.

1. Risacher C Belitsky V Low noise cryogenic IF-amplifiers for super heterodyne radioastronomy receivers Proc 30th Int Symposium on Space Terahertz 2002

2. Cryogenic probe station for on-wafer characterization of electrical devices;Russell;Rev Sci Instrum,2012

3. Weinreb S Cryogenic performance of microwave terminations, attenuators, absorbers, and coaxial cable 1982

4. Delcourt S Dambrine G Bourzgui NE Lepilliet S Laporte C Fraysse JP Maignan M On-wafer high frequency noise power measurements under cryogenic conditions: a new de-embedding approach Microwave Conference 2004 34th European 2004 2 913 916

5. Microwave thermal noise standards;Stelzried;Microwave Theory and Techniques, EEE Transactions on,1968

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