1. An alternative approach to calculation of four-probe resistances on nonuniform structures;Albers;J. Electrochem. Soc.,1985
2. Correction factors for radial resistivity gradient evaluation of semiconductor slices;Albert;IEEE Trans. Electron. Dev.,1964
3. Application Note 1217-1 Basics of measuring the dielectric properties of materials Hewlett-Packard Palo Alto, Calif
4. Standard test method for resistivity of electrical conductor materials,1987
5. Standard test method for electromagnetic (eddy-current) measurement of electrical conductivity,1991