Interface Engineering Enabled Low Temperature Growth of Magnetic Insulator on Topological Insulator-Reference-Cited by-同舟云学术

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Interface Engineering Enabled Low Temperature Growth of Magnetic Insulator on Topological Insulator

Published:2022-10-21 Issue:35 Volume:9 Page:2201691
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv Materials Inter

Author:

Bhattacharjee Nirjhar¹^ORCID,Mahalingam Krishnamurthy²^ORCID,Will‐Cole Alexandria¹^ORCID,Wei Yuyi¹^ORCID,Fedorko Adrian³^ORCID,Bowers Cynthia T.²^ORCID,Page Michael²^ORCID,McConney Michael²^ORCID,Heiman Don³⁴^ORCID,Sun Nian Xiang¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering Northeastern University Boston MA 02115 USA

2. Air Force Research Laboratory Nano‐electronic Materials Branch Wright Patterson Air Force Base Dayton OH 05433 USA

3. Department of Physics Northeastern University Boston MA 02115 USA

4. Plasma Science and Fusion Center MIT Cambridge MA 02139 USA

Funder

National Science Foundation

Air Force Office of Scientific Research

Air Force Research Laboratory

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/admi.202201691

Reference56 articles.

1. Experimental Observation of the Quantum Anomalous Hall Effect in a Magnetic Topological Insulator

2. High-precision realization of robust quantum anomalous Hall state in a hard ferromagnetic topological insulator

3. Magnetic topological insulators

4. Robust axion insulator and Chern insulator phases in a two-dimensional antiferromagnetic topological insulator

5. Direct evidence of ferromagnetism in a quantum anomalous Hall system

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1. Regulated resistive switching behaviors of Pt/Ni0.5Zn0.5Fe2O4/Pt composite films by oxygen pressure;Ceramics International;2024-05

2. Insights into the Stability and Surface Termination of Topological Semimetal NbAs₂;Advanced Materials Interfaces;2024-01-12

3. Antiferromagnetic FeTe2 1T−phase formation at the Sb2Te3/Ni80Fe20 interface;Physical Review Materials;2023-02-15

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