Highly Sensitive Direct‐Conversion Vacuum Flat‐Panel X‐Ray Detectors Formed by Ga <sub>2</sub> O <sub>3</sub> ‐ZnO Heterojunction Cold Cathode and ZnS Target and their Photoelectron Multiplication Mechanism-Reference-Cited by-同舟云学术

Highly Sensitive Direct‐Conversion Vacuum Flat‐Panel X‐Ray Detectors Formed by Ga ₂ O ₃ ‐ZnO Heterojunction Cold Cathode and ZnS Target and their Photoelectron Multiplication Mechanism

Published:2022-02-06 Issue:9 Volume:9 Page:2102268
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv Materials Inter

Author:

Zhang Zhipeng¹,Chen Manni¹,Wang Chengyun¹,Wang Kai¹,Deng Shaozhi¹,Chen Jun¹^ORCID

Affiliation:

1. State Key Laboratory of Optoelectronic Materials and Technologies Guangdong Province Key Laboratory of Display Material and Technology School of Electronics and Information Technology Sun Yat‐sen University Guangzhou 510275 P. R. China

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/admi.202102268

Reference39 articles.

1. Determination of X-ray detection limit and applications in perovskite X-ray detectors

2. Highly Luminescent Metal‐Free Perovskite Single Crystal for Biocompatible X‐Ray Detector to Attain Highest Sensitivity