Nanoscale Measurements of Elastic Properties and Hydrostatic Pressure in H 2 ‐Bulged MoS 2 Membranes-Reference-Cited by-同舟云学术

Nanoscale Measurements of Elastic Properties and Hydrostatic Pressure in H 2 ‐Bulged MoS 2 Membranes

Published:2020-10-07 Issue:23 Volume:7 Page:2001024
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv. Mater. Interfaces

Author:

Di Giorgio Cinzia¹²^ORCID,Blundo Elena³,Pettinari Giorgio⁴,Felici Marco³,Lu Yuerui⁵,Cucolo Anna Maria¹,Polimeni Antonio³,Bobba Fabrizio¹²⁶^ORCID

Affiliation:

1. Department of Physics E.R: Caianiello University of Salerno Fisciano 84084 Italy

2. INFN Sezione di Napoli Gruppo Collegato di Salerno Complesso Universitario di Monte S. Angelo Napoli 80126 Italy

3. Physics Department Sapienza University of Rome Rome 00185 Italy

4. Institute for Photonics and Nanotechnologies National Research Council Rome 00156 Italy

5. Research School of Electrical Energy and Materials Engineering College of Engineering and Computer Science The Australian National University Canberra ACT2601 Australia

6. CNR‐SPIN Fisciano SA 84084 Italy

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/admi.202001024

Reference74 articles.

1. Two-dimensional MoS2: Properties, preparation, and applications

2. Atomically ThinMoS2: A New Direct-Gap Semiconductor

3. Single-layer MoS2 transistors

4. Ultrasensitive photodetectors based on monolayer MoS2

5. Fabrication of Single- and Multilayer MoS2 Film-Based Field-Effect Transistors for Sensing NO at Room Temperature

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