Silicon
Author:
Publisher
John Wiley & Sons, Ltd
Reference14 articles.
1. Perspectives on emissivity measurements and modeling in silicon;Abedrabbo;Mater. Sci. Semicond. Process.,1998
2. Current trends in silicon defect technology;Bullis;Mater. Sci. Eng.,2000
3. The 300 mm silicon wafer -a cost and technology challenge;Hahn;Microelectron. Eng.,2001
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