An expression for the voltage response of a current-excited fractance device based on fractional-order trigonometric identities-Reference-Cited by-同舟云学术

An expression for the voltage response of a current-excited fractance device based on fractional-order trigonometric identities

Published:2011-02-10 Issue:5 Volume:40 Page:533-538
ISSN:0098-9886
Container-title:International Journal of Circuit Theory and Applications
language:en
Short-container-title:Int. J. Circ. Theor. Appl.

Author:

Radwan A. G.,Elwakil A. S.

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/cta.760/fullpdf

Reference19 articles.

1. Basic characteristics of a fractance device;Nakagawa;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences,1992

2. Simulation of fractal immittance by analog circuits: an approach to the optimized circuits;Sugi;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences,1999

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