Comparison of characteristics between inverted and normal structure heterojunction bipolar transistors

Author:

Akagi Junko,Yoshida Jiro,Kurata Mamoru

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,General Physics and Astronomy

Reference13 articles.

1. , , , , , , and . Self-aligned A1GaAs/GaAs HBT's and 35 ps LCML ring oscillators fabricated by Mg and P double implantation, 18th Conf. on Solid State Devices and Materials, pp. 359–361, Tokyo (1986).

2. , , and . High frequency performance of A1GaAs/InGaAs/GaAs strained layer heterojunction bipolar transistors, I.E.E.E. Dev. Res. Conf. Amherst, MA (1986).

3. , and . A model-base comparison; GaAs/GaA1As HBT versus silicon bipolar, IEDM 85 Washington, D.C., 11.5 (Dec. 1985).

4. and . Transient analysis of inverted structure hetero-junction bipolar transistor, I.E.C.E., SSD85-58 (1985).

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