Reliability of capacitive RF MEMS switches at high and low temperatures

Author:

Zhu Yong,Espinosa Horacio D.

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Reference25 articles.

1. RF MEMS: Theory, design and technology, Wiley, New York, 2003.

2. and Life time characterization of capacitive RF MEMS switches, IEEE MTT-S Int Microwave Symp, Phoenix, AZ, 2001, pp. 227-230.

3. and Micro Electro Mechanical Switch (MEMS) technology applied to electronically scanned arrays for space based radar, IEEE Aerospace Conf, Aspen, CO 1999, pp. 239-247.

4. Thermal solutions for discrete and wafer-level rf mems switch packages

5. Environmental test bench for reliability studies: influence of the temperature on rf switches with metallic membranes

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