Reliability Assessment of Metallized Film Capacitors using Reduced Degradation Test Sample

Author:

Sun Quan1,Tang Yanzhen1,Feng Jing1,Jin Tongdan2

Affiliation:

1. College of Information System and Management; National University of Defense Technology; Changsha; HN; 410073; China

2. Ingram School of Engineering; Texas State University; San Marcos; TX; 78666; USA

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference18 articles.

1. Ennis JB MacDougall FW Cooper RA Bates J Self-healing pulse capacitors for the National Ignition Facility (NIF) Proc. of 12 th IEEE International Pulsed Power Conference 1999 1 118 121

2. Larson DW MacDougall FW Yang XH Hardy P The impact of high energy density capacitors with metallized electrode in large capacitor banks for nuclear fusion application Proc. of 9 th IEEE International Pulsed Power Conference 1993 2 735 742

3. Merritt BT Whitham K Performance and cost analysis of large capacitor banks using Weibull statistics and MTBF Proc. of 3 rd IEEE International Pulsed Power Conference 1981 463 466

4. Statistical inference of a time-to-failure distribution derived from linear degradation data;Lu;Technometrics,1997

5. Reliability assessment based on accelerated degradation: A case study;Carey;IEEE Transactions on Reliability,1991

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